Scatterometry for Lithography Process Control and Characterization in IC Manufacturing
$ 562
Availability: Currently in Stock
Delivery: 10-20 working days
Condition: USED (All books are in used condition)
Condition - Very Good The item shows wear from consistent use, but it remains in good condition and functions properly. Item may arrive with damaged packaging or be repackaged. It may be marked, have identifying markings on it, or have minor cosmetic damage. It may also be missing some parts/accessories or bundled items.
Scatterometry for Lithography Process Control and Characterization in IC Manufacturing
