Contents
- Preface
- Overview of lithography
- Optical pattern formation
- Photoresists
- Modeling and thin film effects
- Wafer steppers
- Color Plates overlay
- Masks and reticules
- Overcoming the diffraction limit
- Metrology
- The limits of optical lithography
- Lithography costs
- Alternative lithography techniques
- Appendix A: Coherence
- Index
Country | USA |
Brand | Brand: SPIE Publications |
Manufacturer | SPIE Publications |
Binding | Hardcover |
UnitCount | 1 |
EANs | 9780819456601 |
ReleaseDate | 0000-00-00 |